e-Περιοδικό Επιστήμης & Τεχνολογίας

e-Journal of Science & Technology, (e-JST)


X-Ray Fluorescence Spectroscopy (XRF): Suggestions for Development of Lab-exercises and research applications

Ioannis A. Sianoudis1, Andreas G. Karydas2, Charalambos Zarkadas2, Eleni Drakaki1

1Laboratory of Physics , Department of Physics Chemistry & Material Science, TEI of Athens, 2Laboratory of Material Analysis, Institute of Nuclear Physics, ΕΚΕΦΕDemocritos


The technique of X-ray Fluorescence (XRF) is an important tool, which is used as an analytic method in a broad spectrum of interdisciplinary applications. The specific characteristics of this technique are the simultaneous and expeditious determination of the elements from almost the whole periodical Table (Z=14-92), also the high sensitivity in the analysis with detective border, which usually vary in the range of μg/g (ppm). As characteristic applications of the method could refer the determination of the consistence of metallic alloys and also of thin layers with technological applications, the traces in environmental probes (soil, aerosols deposed in filter) and also in the non destructive analysis of archaeological objects and works of art. In the present work we show a number of measurements on different probes and suggest also the possibilities to use the method for educational purposes for physics undergraduate Labs: a) the verification of the low of Moseley, b) the Compton effect and c) the low of X rays absorption.